An X- ray fluorescence (XRF) spectrometer is an x ray instrument used for routine, relatively non-destructive chemical analysis of rocks, minerals, sediments and fluids. It works on wavelength-dispersive spectroscopic principles that are similar to an electron microprobe (EPMA). However, an XRF is used for bulk analysis of larger fractions of geological materials. The relative ease and low cost of sample preparation, and the stability and ease of use of x ray spectrometers make this one of the most widely used methods for analysis of major and trace elements in rocks, minerals and sediment.